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China, Chinese Nano-Resolution Semiconductor Wafer Afm Microscope1 Industrial Products Supplier Manufacturer Details, price list catalog:
China Products Details Supplier Manufacturer price list catalog
Optical Lens InstrumentNano-Resolution Afm MicroscopeSemiconductor Wafer Microscope
Suzhou FlyingMan Precision Instruments Co., Ltd.
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Product Description Suzhou FlyingMan Precision Instruments Co., Ltd. presents the Nano-Resolution Semiconductor Wafer AFM Microscope for high-quality imaging and analysis in the wafer industry.Product Description Features The first large-scale industrial atomic force microscope in China to achieve commercial productionCapable of testing large samples such as wafers, ultra large gratings, and optical glassSample stage with strong expandability for multi instrument combinationOne-click automatic scanning for fast and automated detectionXYZ 3D motion measurement imaging with stationary sampleGantry scanning head design with marble base and vacuum adsorption stageMechanical vibration damping and environmental noise shielding solutionsIntelligent needle insertion method for automatic detection of piezoelectric ceramicsScanner nonlinear correction user editor for nano characterization and high measurement accuracy Software Two sampling pixel options: 256×256, 512×512Execute scan area move and cut functionScan sample in random angle at beginningReal-time adjustment of laser spot detection systemChoose and set different color of scanning image in paletteSupport linear average and offset calibration in real time for sample titleScanner sensitivity calibration and electronic controller auto-calibrationSupport offline analysis and process of sample image Company: Suzhou FlyingMan Precision Instruments Co., Ltd. Product ParametersWorking modeContact mode, Tapping modeZ Lifting tableStepper motor drive control with a minimum step size of 10nmOptional modeFriction force/lateral force, amplitude/phase,magnetic force/electrostatic forceZ Lifting stroke20mm (optional 25mm)Force spectrum curveF-Z force curve, RMS-Z curveOptical positioning10X optical objectiveXYZ Scanning method Probe driven XYZ scanningCamera5 megapixel digital CMOSXY Scanning RangeGreater than 100um×100umScan rate0.6Hz~30HzZ Scan angleGreater than 10umScan angle0~360°Scanning resolutionHorizontal 0.2nm, vertical 0.05nmOperating environmentWindows 10operating system XY Sample StageStepper motor drive control, with a movement accuracy of 1umCommunication interfaceUSB2.0/3.0XY Shift motion200×200mm(Optional 300×300mm)Instrument structureGantry scanning head, marble baseSample loading platformDia 200mm(Optional 300mm)Damping methodAir floating shock absorption acoustic shielding cover (optional active shock absorption platform)Sample Weight≤20Kg III. Main Technical Parameters Suzhou FlyingMan Precision Instruments Co., Ltd. introduced the FSM in 2013. With a focus on creating instruments for laboratories and factories over the past 9 years, we offer an atomic force microscope designed for physical education and wafer inspection purposes. Our AFM boasts the best cost ratio in the market, making it a top choice for various applications. Detailed Photos
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