High Precision Tungsten Probe Tips for Fib Tem IC Chip Testing -OEM Custom Nano Tip Needle¹

Product Description High Precision Tungsten Probe Tips for FIB TEM IC Chip Testing -OEM Custom Nano Tip Needle  Our high-precision tungsten probe tips are designed for demanding applications that require exceptional strength, electrical conductivity, and tip sharpness. These probes are custom-machined with tip areas as small as 1 micron, and are widely used in semiconductor testing, microdissection, material analysis, and clean energy sectors. Each probe is manufactured using premium-grade materials to ensure durability, stability, and accuracy under extreme conditions. Product DescriptionSpecifications and Customization RangeTo meet your unique performance and design needs, we offer a wide range of specifications that can be tailored to your application. ParameterRangeTip Size1 μm - 50 μmTip ShapeStandard, Conical, Flat, CustomProbe Diameter0.076 mm - 1.2 mmLength15 mm - 300 mmTolerance±0.001 mmSurface FinishPolished, Ground, CoatedAngle/Tip FormingCustom available (laser cut, micro-grind) We also offer advanced processing options such as slotting, bending, plating, and integration with sleeves (copper/stainless steel) Key Product Features Material Options:Pure tungsten ≥99.95%Rhenium tungsten alloy (optional)Japanese tungsten available upon requestPrecision Machining:Tip radius down to 50 nanometersMachining tolerance ±0.001 mmCone smoothness: Ra ≤ 0.25 (mirror finish) Custom Tip Shapes:Sharp / Ultra-sharpFlat platformArc-shapedCustom Coatings & Sleeves:Full or partial Nickel tin plating, Gold platingOptional die-cast copper or stainless steel sleeve  Strict Quality Control:Each needle 100% inspected individually before shipmentSEM and optical testing available upon request  ApplicationsApplicationsProfessionals across multiple industries trust tungsten probe tips from Yolo for their exceptional precision and endurance.Here's how our probes are used in the real world: 1. LED Chip Testing and Quality InspectionIn LED manufacturing, probes must make precise electrical contact with tiny chip surfaces without causing damage.Why our probes are ideal:High hardness and elasticity prevent bending or tip deformation.Non-destructive probing protects sensitive chip structures.Custom tip shapes improve contact and reduce false signals.Used in: Chip testing equipment, probe stations, and automated LED quality control setups. 2. Semiconductor Wafer Testing and IC ProbingSemiconductor fabs rely on ultra-precise probing for wafer-level testing, failure analysis, and debugging of integrated circuits.Why our probes are ideal:Sub-micron tip radius for contacting densely packed test pads.Reliable conductivity ensures accurate voltage/current readings.Compatibility with probe cards and precision manipulators.Used in: Wafer sorters, memory and logic IC testing, R&D labs. 3. Focused Ion Beam (FIB) SystemsIn FIB-based sample prep, especially for TEM lamella lift-out, tungsten probes act as manipulators to lift and place ultra-thin samples.Why our probes are ideal:Custom tip shapes compatible with Thermo Fisher EasyLift, Zeiss, and other systems.Tip radius as small as 50 nanometers ensures minimal contact force.Ra0.25 or better finish for clean handling under electron and ion beams.Used in: Failure analysis labs, nano-fabrication labs, academic research facilities. 4. In-Situ TEM Sample PreparationTEM requires samples that are ultra-thin and cleanly lifted from the substrate. Probe tips help extract these from the bulk material.Why our probes are ideal:Strong yet precise enough to lift fragile lamella without breakage.Customization to fit different lift-out grid holders.No tip contamination ensures clearer TEM imaging results.Used in: Transmission electron microscopy, materials research, nanoscale defect analysis. 5. Micro-Mechanical and MEMS TestingMEMS and micro-mechanical systems require fine-scale manipulation and mechanical testing with precision force application.Why our probes are ideal:High stiffness and elasticity for applying nano-Newton-scale forces.Optional coatings and sleeves to adapt to varied materials.Smooth tips reduce risk of breakage or sample scratching.Used in: MEMS testing platforms, nano-indentation systems, material deformation analysis. Materials Available for Probe TipsTo meet different performance and environmental needs, our probe tips are available in four high-quality material options. Each material is selected based on its unique mechanical, electrical, and thermal properties, making them suitable for various industrial and research applications. MaterialCodeProbe Diameter Range (mm)Length Range (mm)Tip Area (μm)Density (g/cm3)Resistivity at 20°C (μΩ·cm)Melting Temp (°C)Yield Strength (MPa)Hardness (Knoop)Modulus of Elasticity (GPa)CompositionPure TungstenW0.076 - 1.215 - 3000.08 - 5019.3~5.6534102900740400Tungsten 99.98%Al, Si, K Doped TungstenW0.076 - 1.215 - 3000.08 - 5019.3~5.6534102900740400Tungsten 99.95%Rhenium TungstenWRe0.076 - 1.015 - 2500.08 - 5019.3~9.6534273360780410Tungsten 97% + Rhenium 3%Paliney 7Pa70.3 - 0.815 - 501 - 2011.8~31.61016930380117Noble Alloy Material Selection GuidePure Tungsten - Ideal for general-purpose probing where high hardness and high melting point are critical.AlSiK Doped Tungsten - Offers slightly improved grain structure stability; preferred for ultra-fine tips.Rhenium Tungsten (WRe) - Higher strength and elasticity; ideal for high-temperature or dynamic probing.Paliney 7 - Precious alloy with excellent electrical conductivity and corrosion resistance; ideal for delicate or highly conductive applications. We support material customization to match your exact application. Just let us know your testing environment or target equipment, and we'll recommend the best match. Company Profile About Yolo Materials With decades of experience in precision tungsten and molybdenum manufacturing, Yolo provides high-quality probe tips trusted in the semiconductor, medical, and environmental industries. We control every step of the production-from raw material to final product-to guarantee performance and consistency.  Premium Material Control: We process from our tungsten to ensure stable, high-purity raw material quality.Ultra-Fine Precision Machining: Proven tip control down to 50nm, with 0.001mm machining tolerance.100% Inspection: Each tip undergoes full optical inspection before packing.Full Custom Support: We work closely with clients to meet design drawings and system fit.Trusted Supplier: Supplying probe solutions to top-tier LED and semiconductor brands. Packaging & DeliveryPackaging: Anti-static boxes/custom blister trays / protective tubesDelivery: 15-20 working days, depending on customizationMOQ: Negotiable (sample orders supported) Contact Us Now for Samples & Customization! We welcome OEM/ODM orders and support small-volume precision testing probes. Click "Contact Supplier" to get your tailored solution!

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