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Cost-Efficient Nanoview Atomic Force Microscope1
Optical Lens InstrumentNanoview Atomic Force MicroscopeCost-Efficient Digital Microscope
Suzhou FlyingMan Precision Instruments Co., Ltd.
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Product Description Introducing the FM-NanoView TAPPING Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd. A cost-efficient solution for high-quality imaging and analysis in research and educational settings. Product DescriptionProduct DescriptionFeaturesScan head and sample stage designed together for strong anti-vibration performancePrecision laser detection and probe alignment device for easy laser adjustmentServomotor drive for precise scanning area positioningHigh-accuracy sample transfer device for scanning any area of interestOptical observation system for tip check and sample positioningModular electronic system for easy maintenance and developmentSpring vibration isolation for simple and effective performanceSoftwareTwo sampling pixel options: 256×256, 512×512Functionality for moving and cutting scan areasRandom angle scanning at the startReal-time adjustment of laser spot detection systemCustomizable scanning image colors in paletteSupport for linear average and offset calibrationScanner sensitivity and electronic controller auto-calibrationOffline analysis and processing of sample imagesManufactured by Suzhou FlyingMan Precision Instruments Co., Ltd. Product ParametersMain Technical ParametersExplore the key technical specifications of the Cost-Efficient NanoView Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.ItemTechnical dataItemTechnical dataOperation modesContact mode, friction mode, extended modes of Tapping, phase, MFM, EFM.Scan angleRandomSample sizeΦ≤90mm,H≤20mmSample movement0~20mmMax. scan rangeX/Y: 20 um, Z: 2 umPulse width of approaching motor10±2msResolutionX/Y: 0.2 nm, Z: 0.05nmOptical systemMagnification: 4X, resolution: 2.5 umScan rate0.6Hz~4.34HzData points256×256,512×512Scanning controlXY: 18-bit D/A, Z: 16-bit D/AFeedback typeDSP digital feedbackData samplingOne 14-bit A/D and double 16-bit A/D multiple-channel simultaneously PC connectionUSB2.0Feedback sampling rate64.0KHzWindowsCompatible with Windows98/2000/XP/7/8Atomic Force Microscope by Suzhou FlyingMan Precision Instruments Co., Ltd.Atomic Force MicroscopeSuzhou FlyingMan Precision Instruments Co., Ltd. has been specializing in building instruments for labs and factories since 2013. Our Atomic Force Microscope (AFM) is designed for physical education and wafer inspection, offering the best cost ratio in the market.Features:High precision imaging for accurate analysisEasy to use interface for efficient operationVersatile applications in various industriesBenefits:Enhances research and development processesImproves quality control in manufacturingCost-effective solution for advanced microscopy Detailed Photos
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