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Wide Angle Submicron Laser Analyzer for Particle Size1
Analysis Instrument, Laser Particle Size Analyzer, Submicron Laser Analyzer, Wide Angle Particle Analyzer
Liaoyang Bright Shine Pharmaceutical Machinery Imp & Exp Co., Ltd.
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Product DescriptionProduct DescriptionWide Angle Submicron Laser Analyzer For Particle SizeThe BHY-1080 Laser Particle Size Analyzer represents a new-generation instrument featuring a measurement range extending down to 40 nanometers. Its optical system incorporates a 71-cell main photodetector array with a detection angle of 21.5°, complemented by a non-uniform cross-arranged side/backward photodetector array with 9 cells at 135°.The instrument integrates an advanced reverse Fourier optical design with a unique monolithic optical path structure, ensuring exceptional long-term stability without the need for realignment. Precision mechanical engineering and streamlined design result in a compact, robust, and ergonomic instrument that facilitates both operation and maintenance.Enhanced electromagnetic shielding and interference suppression technologies guarantee stable electrical performance, delivering highly accurate and reproducible results.SpecificationKey FeaturesBHY-300 Recirculating Sampler (Optional)Integrated ultrasonic dispersion, circulation, stirring with timer.Peristaltic pump prevents sample contamination.Dual cells: Micro Cell (organic solvents) & Circulating Cell (aqueous media), switchable without replacement.Advanced Software SystemDedicated computer analysis software for data processing.Printer-compatible test report output.Integrated Optical Path TechnologyOptimized inverse Fourier optical design with monolithic structure (no realignment needed).Streamlined mechanical design for compact layout and ergonomic maintenance.EMI/RFI shielding ensures electrical stability.135° Wide-Angle Detector Array71-element main detector array (21.5° forward detection).9-element lateral/backscatter array in non-uniform cross-arrangement (135° backscatter detection).25,000-Hour Laser DurabilitySemiconductor laser (λ=635nm, 3mW) with extended lifespan.H.Golub Inversion AlgorithmFull Mie scattering theory implementation for mono-/poly-disperse samples.Customizable Report FormatsExportable cumulative/interval distribution data, curves, histograms, and key metrics (D10/D50/D90).ISO 13320-1:2020 ComplianceValidated with certified reference materials.ParameterSpecificationMeasurement Range0.04μm (40nm) – 500μmLight SourceSemiconductor Laser (635nm, 3mW)Sample MethodWet Method OnlySample Concentration0.5‰ – 1%Test Time<1 minute/test (excl. dispersion)Scanning Speed2,000 scans/secondRepeatability Error≤1%Power Supply220V±10%, 50/60Hz, 80WComputer InterfaceRS-232 Serial Port (PC-controlled)Operating SystemWindows All VersionsDetector Configuration71+9 photodetector arrayMax Detection Angle135° backscatterCompany ProfileCertificationsAfter Sales Service
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