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Semiconductor Mono-Crystal X-ray Orientation Unit for Seed Crystal Testing1
DetectorOrientation of Single-Crystal WafersMono-Crystal X-ray Orientation Unit
Jiaozuo Commercial Finewin Co., Ltd.
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Product DescriptionProduct Descriptionwhat is X-Ray Orientation Unit & ApplicationA Semiconductor Mono-Crystal X-Ray Orientation Unit is a specialized instrument used to determine the precise crystallographic orientation of single-crystal semiconductor wafers, typically silicon, germanium, or gallium arsenide. This is crucial because the crystal orientation significantly impacts the properties and performance of semiconductor devices. The unit utilizes X-ray diffraction techniques to analyze the crystal structure and determine the orientation with high accuracy, often within a few angular seconds. Applications:Semiconductor Manufacturing:Ensuring proper crystal orientation is critical for fabricating high-performance transistors, diodes, and other semiconductor components. Material Science Research:Studying the relationship between crystal orientation and material properties. Quality Control:Verifying the orientation of wafers during production to ensure consistency and quality. Research and Development:Exploring new materials and processes that rely on specific crystal orientations. DXB-S7BG Manualmeasurement of ingots/wafers7B(G)/7A(G)/WSerial? The Equipment is a Double-work bench.? Measurement of the angle in the direction of the end face or reference edge of the wafer/ingot.? Manually operated measurements, manual judgement of peaks.? Variety of other sample stages are available, suitable for special size crystals, and special measurement requirements.7BN (G) /7AN(G)Serial? The Equipment is a Double-work bench.? Measurement of the angle of the end face or NOTCH crystal direction of the ingots/wafer.? Manually operated measurements, manual judgement of peaks.Equipment Pertormance? Supports multi-angle orientation.(θ:0~50°)? Automatic positioning of X-ray focus height.? The equipment is equipped with a rotating worktable, which allows the crystal under test to rotate and orient 360°.? Calibration-free, no need for daily equipment calibration.? Selective touch screen operation simplifies input conditions and reduces misoperation rates.? The crystal after end face grinding can also be re-inspected.SpecificationItemSpecifications(8BD600AG)Specifications(8BD800AG)Crystal SpecificationsCrystal Balls/ ingots up to 200kgCrystal Balls/ ingots up to 450kgMeasuring space (with fixtures and crystals)MAX:600(Inches)X500(High)mmlargest:800(Inches)X750(High)mmMeasurement angle0~50°0~50°Accuracy±30″±30″
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